Exposure model for prediction of number of customer reported defects

Keld Raaschou; Austen Rainer

doi:10.1145/1414004.1414062

Exposure model for prediction of number of customer reported defects

Keld Raaschou^*, Austen Rainer

^*Corresponding author for this work

School of Electronics, Electrical Engineering and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

The paper describes a mathematical model, the Exposure Model, for the prediction of customer reported defects in a large software system. In the model, exposure is defined as the likely fraction of the original defects in the software system that is reported by any customer, in any month and against any version of the system. The basic idea is to try to model exposure as the product of the isolated effects of a few customer- and system-characteristics. The model has been used for several purposes: to better understand defect detection mechanisms, and to better predict the resources required for defect correction. Also, the model has enabled us to make an early estimate of product quality, and thereby give valuable input for other important purposes.

Original language	English
Title of host publication	ESEM'08
Subtitle of host publication	Proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement
Pages	306-308
Number of pages	3
DOIs	https://doi.org/10.1145/1414004.1414062
Publication status	Published - 01 Dec 2008
Event	2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008 - Kaiserslautern, Germany Duration: 09 Oct 2008 → 10 Oct 2008

Conference

Conference	2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008
Country/Territory	Germany
City	Kaiserslautern
Period	09/10/2008 → 10/10/2008

Keywords

Estimation of field defects
Exposure model
Prediction

ASJC Scopus subject areas

Computer Science Applications
Software
Electrical and Electronic Engineering

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10.1145/1414004.1414062

Cite this

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title = "Exposure model for prediction of number of customer reported defects",

abstract = "The paper describes a mathematical model, the Exposure Model, for the prediction of customer reported defects in a large software system. In the model, exposure is defined as the likely fraction of the original defects in the software system that is reported by any customer, in any month and against any version of the system. The basic idea is to try to model exposure as the product of the isolated effects of a few customer- and system-characteristics. The model has been used for several purposes: to better understand defect detection mechanisms, and to better predict the resources required for defect correction. Also, the model has enabled us to make an early estimate of product quality, and thereby give valuable input for other important purposes.",

keywords = "Estimation of field defects, Exposure model, Prediction",

author = "Keld Raaschou and Austen Rainer",

year = "2008",

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doi = "10.1145/1414004.1414062",

language = "English",

isbn = "9781595939715",

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Raaschou, K & Rainer, A 2008, Exposure model for prediction of number of customer reported defects. in ESEM'08: Proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement. pp. 306-308, 2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, Kaiserslautern, Germany, 09/10/2008. https://doi.org/10.1145/1414004.1414062

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AU - Raaschou, Keld

AU - Rainer, Austen

PY - 2008/12/1

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N2 - The paper describes a mathematical model, the Exposure Model, for the prediction of customer reported defects in a large software system. In the model, exposure is defined as the likely fraction of the original defects in the software system that is reported by any customer, in any month and against any version of the system. The basic idea is to try to model exposure as the product of the isolated effects of a few customer- and system-characteristics. The model has been used for several purposes: to better understand defect detection mechanisms, and to better predict the resources required for defect correction. Also, the model has enabled us to make an early estimate of product quality, and thereby give valuable input for other important purposes.

AB - The paper describes a mathematical model, the Exposure Model, for the prediction of customer reported defects in a large software system. In the model, exposure is defined as the likely fraction of the original defects in the software system that is reported by any customer, in any month and against any version of the system. The basic idea is to try to model exposure as the product of the isolated effects of a few customer- and system-characteristics. The model has been used for several purposes: to better understand defect detection mechanisms, and to better predict the resources required for defect correction. Also, the model has enabled us to make an early estimate of product quality, and thereby give valuable input for other important purposes.

KW - Estimation of field defects

KW - Exposure model

KW - Prediction

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M3 - Conference contribution

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BT - ESEM'08

T2 - 2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008

Y2 - 9 October 2008 through 10 October 2008

ER -

Exposure model for prediction of number of customer reported defects

Abstract

Conference

Keywords

ASJC Scopus subject areas

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