Exposure model for prediction of number of customer reported defects

Keld Raaschou*, Austen Rainer

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The paper describes a mathematical model, the Exposure Model, for the prediction of customer reported defects in a large software system. In the model, exposure is defined as the likely fraction of the original defects in the software system that is reported by any customer, in any month and against any version of the system. The basic idea is to try to model exposure as the product of the isolated effects of a few customer- and system-characteristics. The model has been used for several purposes: to better understand defect detection mechanisms, and to better predict the resources required for defect correction. Also, the model has enabled us to make an early estimate of product quality, and thereby give valuable input for other important purposes.

Original languageEnglish
Title of host publicationESEM'08
Subtitle of host publicationProceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement
Pages306-308
Number of pages3
DOIs
Publication statusPublished - 01 Dec 2008
Event2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008 - Kaiserslautern, Germany
Duration: 09 Oct 200810 Oct 2008

Conference

Conference2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008
CountryGermany
CityKaiserslautern
Period09/10/200810/10/2008

Keywords

  • Estimation of field defects
  • Exposure model
  • Prediction

ASJC Scopus subject areas

  • Computer Science Applications
  • Software
  • Electrical and Electronic Engineering

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