Far-Field Optical Microscopy with a Nanometer-Scale Resolution Based on the In-Plane Image Magnification by Surface Plasmon Polaritons

I.I. Smolyaninov, J. Elliott, Anatoly Zayats, C.C. Davis

Research output: Contribution to journalArticlepeer-review

175 Citations (Scopus)

Abstract

A new far-field optical microscopy capable of reaching nanometer-scale resolution is developed using the in-plane image magnification by surface plasmon polaritons. This approach is based on the optical properties of a metal-dielectric interface that may provide extremely large values of the effective refractive index neff up to 103 as seen by surface polaritons, and thus the diffraction limited resolution can reach nanometer-scale values of lambda/2neff. The experimental realization of the microscope has demonstrated the optical resolution better than 60 nm at 515 nm illumination wavelength.
Original languageEnglish
Article number057401
Pages (from-to)057401-1-057401-4
Number of pages4
JournalPhysical Review Letters
Volume94
Issue number5
DOIs
Publication statusPublished - 11 Feb 2005

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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