Abstract
An industrial, confined, dual frequency, capacitively coupled, radio-frequency plasma etch reactor Exelan®, Lam Research has been modified for spatially resolved optical measurements. Space and phase resolved optical emission spectroscopy yields insight into the dynamics of the discharge. A strong coupling of the two frequencies is observed in the emission profiles. Consequently, the ionization dynamics, probed through excitation, is determined by both frequencies. The control of plasma density by the high frequency is, therefore, also influenced by the low frequency. Hence, separate control of plasma density and ion energy is rather complex.
Original language | English |
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Article number | 261502 |
Pages (from-to) | 261502-1-261502-3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 89 |
Issue number | 26 |
DOIs | |
Publication status | Published - Dec 2006 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)