High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser

L. Wollenweber*, T. R. Preston, A. Descamps, V. Cerantola, A. Comley, J. H. Eggert, L. B. Fletcher, G. Geloni, D. O. Gericke, S. H. Glenzer, S. Göde, J. Hastings, O. S. Humphries, A. Jenei, O. Karnbach, Z. Konopkova, R. Loetzsch, B. Marx-Glowna, E. E. McBride, D. McGonegleG. Monaco, B. K. Ofori-Okai, C. A.J. Palmer, C. Plückthun, R. Redmer, C. Strohm, I. Thorpe, T. Tschentscher, I. Uschmann, J. S. Wark, T. G. White, K. Appel, G. Gregori, U. Zastrau

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)
97 Downloads (Pure)

Abstract

We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-backscattering geometry to reach a high spectral resolution. An energy resolution of 44 meV is demonstrated for the experimental setup, close to the theoretically achievable minimum resolution. The analyzer crystals and detector are mounted on a curved-rail system, allowing quick and reliable changes in scattering angle without breaking vacuum. The entire setup is designed for operation at 10 Hz, the same repetition rate as the high-power lasers available at the instrument and the fundamental repetition rate of the European XFEL. Among other measurements, it is envisioned that this setup will allow studies of the dynamics of highly transient laser generated states of matter.

Original languageEnglish
Article number013101
Number of pages9
JournalReview of Scientific Instruments
Volume92
Issue number1
DOIs
Publication statusPublished - 04 Jan 2021

Bibliographical note

Funding Information:
We acknowledge the European XFEL in Schenefeld, Germany, for provision of x-ray free-electron laser beamtime at the Scientific Instrument HED (High Energy Density Science) and would like to thank the staff for their assistance. The authors are indebted to the HIBEF user consortium for the provision of instrumentation and staff that enabled this experiment. K.A., T.T., and R.R. acknowledge support from the DFG (Grant No. FOR 2440). Z.K. and C.P. acknowledge support from the DFG Project KO-5262/1. A.D. acknowledges funding from the National Science Foundation under Grant No. 163270. We further acknowledge that this work was supported by the Department of Energy, Laboratory Directed Research and Development program at the SLAC National Accelerator Laboratory under Contract No. DE-AC02-76SF00515 and as part of the Panofsky Fellowship awarded to E.E.M. Furthermore, J.S.W. acknowledges support from the UK EPSRC under Grant No. EP/S025065/1. O.S.H. and O.K. acknowledge support from the Oxford Centre for High Energy Density Science (OxCHEDS). This material is partially based on the work supported by the U.S. Department of Energy, Office of Science, Office of Fusion Energy Science under Award No. DE-SC0019268.

Publisher Copyright:
© 2021 Author(s).

Copyright:
Copyright 2021 Elsevier B.V., All rights reserved.

ASJC Scopus subject areas

  • Instrumentation

Fingerprint

Dive into the research topics of 'High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser'. Together they form a unique fingerprint.

Cite this