High-Selectivity E-Band Image-Reject Filters in SiGe Technology

Mury Thian, Marc Tiebout, Franz Dielacher, Vincent Fusco

Research output: Contribution to conferencePaper

139 Downloads (Pure)
Original languageEnglish
Number of pages3
Publication statusPublished - 05 Nov 2014
EventAsia-Pacific Microwave Conference - Sendai, Japan
Duration: 04 Nov 201407 Nov 2014

Conference

ConferenceAsia-Pacific Microwave Conference
CountryJapan
CitySendai
Period04/11/201407/11/2014

Cite this

Thian, M., Tiebout, M., Dielacher, F., & Fusco, V. (2014). High-Selectivity E-Band Image-Reject Filters in SiGe Technology. Paper presented at Asia-Pacific Microwave Conference, Sendai, Japan. http://apmc2014.org/pdf/apmc14_ad-program.pdf