Abstract
Hydrogen is detected using a Pd/n-InP Schottky diode in which the elongated, very thin Pd electrode is of greater resistance than the underlying semiconductor substrate. Four-probe measurements of the device resistance, as a function of hydrogen concentration, are made by contacting only the Pd electrode, with a sensitivity of 1 ppm being achieved. On hydrogen exposure the device resistance drops from an initial high value, characteristic of the Pd electrode alone, to a lower value due to a hydrogen-induced lowering of the Schottky barrier that opens up the InP substrate as a parallel current carrying channel.
| Original language | English |
|---|---|
| Article number | 422201 |
| Pages (from-to) | - |
| Number of pages | 5 |
| Journal | Journal of Physics: Condensed Matter |
| Volume | 23 |
| Issue number | 42 |
| DOIs | |
| Publication status | Published - 26 Oct 2011 |
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