Impact of buried oxide thickness and ground plane resistivity on substrate cross-talk in Ground Plane Silicon-on-Insulator (GPSOI) cross-talk suppression technology

Mervyn Armstrong, Michael Bain, Paul Baine, Harold Gamble

Research output: Contribution to conferencePaper

Original languageEnglish
Pages84-85
Number of pages2
Publication statusPublished - Oct 2004
EventProceedings - IEEE Intl SOI Conf, Proceedings, p 84-85 - Charleston, United States
Duration: 01 Oct 200401 Oct 2004

Conference

ConferenceProceedings - IEEE Intl SOI Conf, Proceedings, p 84-85
Country/TerritoryUnited States
CityCharleston
Period01/10/200401/10/2004

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