In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers

Ben C. King; Richard J.E. Taylor; Pavlo Ivanov; Iain Butler; Timothy S. Roberts; David T.D. Childs; Richard A. Hogg

doi:10.1109/ISLC.2018.8516218

In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers

Ben C. King, Richard J.E. Taylor, Pavlo Ivanov, Iain Butler, Timothy S. Roberts, David T.D. Childs, Richard A. Hogg

School of Mathematics and Physics

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

We present a method for the in-line non-destructive characterisation of photonic crystal surface emitting lasers. We show through photoluminescence measurement at the point of photonic crystal definition that the etch depth and fill factor can be determined through comparison to band structure modelling.

Original language	English
Title of host publication	Conference Digest - IEEE International Semiconductor Laser Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	165-166
Number of pages	2
ISBN (Print)	9781538664865
DOIs	https://doi.org/10.1109/ISLC.2018.8516218
Publication status	Published - 30 Oct 2018

Publication series

Name	Conference Digest - IEEE International Semiconductor Laser Conference
Volume	2018-September
ISSN (Electronic)	1947-6981

Access to Document

10.1109/ISLC.2018.8516218Licence: Unspecified

Gallium Arsenide based photonic crystal surface emitting lasers
Author: King, B., Dec 2021
Supervisor: Hogg, R. (External person) (Supervisor), Childs, D. (External person) (Supervisor) & Pollard, R. (Supervisor)
Student thesis: Doctoral Thesis › Doctor of Philosophy

Cite this

King, B. C., Taylor, R. J. E., Ivanov, P., Butler, I., Roberts, T. S., Childs, D. T. D., & Hogg, R. A. (2018). In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. In Conference Digest - IEEE International Semiconductor Laser Conference (pp. 165-166). (Conference Digest - IEEE International Semiconductor Laser Conference; Vol. 2018-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISLC.2018.8516218

King, Ben C. ; Taylor, Richard J.E. ; Ivanov, Pavlo ; Butler, Iain ; Roberts, Timothy S. ; Childs, David T.D. ; Hogg, Richard A. / In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. Conference Digest - IEEE International Semiconductor Laser Conference. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 165-166 (Conference Digest - IEEE International Semiconductor Laser Conference).

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title = "In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers",

abstract = "We present a method for the in-line non-destructive characterisation of photonic crystal surface emitting lasers. We show through photoluminescence measurement at the point of photonic crystal definition that the etch depth and fill factor can be determined through comparison to band structure modelling.",

author = "King, {Ben C.} and Taylor, {Richard J.E.} and Pavlo Ivanov and Iain Butler and Roberts, {Timothy S.} and Childs, {David T.D.} and Hogg, {Richard A.}",

year = "2018",

month = oct,

day = "30",

doi = "10.1109/ISLC.2018.8516218",

language = "English",

isbn = "9781538664865",

series = "Conference Digest - IEEE International Semiconductor Laser Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "165--166",

booktitle = "Conference Digest - IEEE International Semiconductor Laser Conference",

}

King, BC, Taylor, RJE, Ivanov, P, Butler, I, Roberts, TS, Childs, DTD & Hogg, RA 2018, In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. in Conference Digest - IEEE International Semiconductor Laser Conference. Conference Digest - IEEE International Semiconductor Laser Conference, vol. 2018-September, Institute of Electrical and Electronics Engineers Inc., pp. 165-166. https://doi.org/10.1109/ISLC.2018.8516218

In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. / King, Ben C.; Taylor, Richard J.E.; Ivanov, Pavlo; Butler, Iain; Roberts, Timothy S.; Childs, David T.D.; Hogg, Richard A.

Conference Digest - IEEE International Semiconductor Laser Conference. Institute of Electrical and Electronics Engineers Inc., 2018. p. 165-166 (Conference Digest - IEEE International Semiconductor Laser Conference; Vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceeding › Chapter

TY - CHAP

T1 - In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers

AU - King, Ben C.

AU - Taylor, Richard J.E.

AU - Ivanov, Pavlo

AU - Butler, Iain

AU - Roberts, Timothy S.

AU - Childs, David T.D.

AU - Hogg, Richard A.

PY - 2018/10/30

Y1 - 2018/10/30

N2 - We present a method for the in-line non-destructive characterisation of photonic crystal surface emitting lasers. We show through photoluminescence measurement at the point of photonic crystal definition that the etch depth and fill factor can be determined through comparison to band structure modelling.

AB - We present a method for the in-line non-destructive characterisation of photonic crystal surface emitting lasers. We show through photoluminescence measurement at the point of photonic crystal definition that the etch depth and fill factor can be determined through comparison to band structure modelling.

U2 - 10.1109/ISLC.2018.8516218

DO - 10.1109/ISLC.2018.8516218

M3 - Chapter

SN - 9781538664865

T3 - Conference Digest - IEEE International Semiconductor Laser Conference

SP - 165

EP - 166

BT - Conference Digest - IEEE International Semiconductor Laser Conference

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

King BC, Taylor RJE, Ivanov P, Butler I, Roberts TS, Childs DTD et al. In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. In Conference Digest - IEEE International Semiconductor Laser Conference. Institute of Electrical and Electronics Engineers Inc. 2018. p. 165-166. (Conference Digest - IEEE International Semiconductor Laser Conference). https://doi.org/10.1109/ISLC.2018.8516218

In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers

Abstract

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Student theses

Gallium Arsenide based photonic crystal surface emitting lasers

Cite this