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Influence of charged walls and defects on DC resistivity and dielectric relaxations in Cu-Cl boracite
C. Cochard*, T. Gransow, C.M. Fernández-Posada, M.A. Carpenter, R.G.P. McQuaid, J.G.M. Guy, R.W. Whatmore, J.M. Gregg
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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