A method of injecting metallic elements into an electron-beam ion trap (EBIT) is described. The method is advantageous over the conventional coaxial and pulsed injection methods in two ways: (a) complicated switching of injection and extraction beams can be avoided when extracting beams of highly charged ions from the EBIT and (b) a beam of stable intensity can be achieved. This method may be applicable to any metallic elements or metallic compounds that have vapor pressures of similar to 0.1 Pa at a temperature lower than 1900 degrees C. We have employed this method for the extraction of highly charged ions of Bi, Er, Fe, and Ho. (c) 2006 American Institute of Physics.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)