Insights into Gate-Underlap Design in FinFETs for Ultra-Low Voltage Analog Performance

Abhinav Kranti, Alastair Armstrong

Research output: Contribution to conferencePaper

6 Citations (Scopus)
Original languageEnglish
Pages29-30
Number of pages2
Publication statusPublished - Oct 2007
EventIEEE International SOI Conference - Indian Wells, Ca, United States
Duration: 01 Oct 200701 Oct 2007

Conference

ConferenceIEEE International SOI Conference
CountryUnited States
CityIndian Wells, Ca
Period01/10/200701/10/2007

Cite this

Kranti, A., & Armstrong, A. (2007). Insights into Gate-Underlap Design in FinFETs for Ultra-Low Voltage Analog Performance. 29-30. Paper presented at IEEE International SOI Conference, Indian Wells, Ca, United States.