Internal photoemission study on charge trapping behaviour in rapid thermal oxides on strained-Si/SiGe heterolayers

Mervyn Armstrong, Harold Gamble, M.K. Bera, C. Mahata, S. Bhattacharya, A.K. Chakraborty, C.K. Maiti

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)2971-2977
Number of pages7
JournalApplied Surface Science
Volume255
Publication statusPublished - Sep 2008

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