Investigation of crystalline quality and stress in germanium stripes fabricated by rapid melt growth process

T.S. Perova, Nurfarina Zainal, D. Adley, Neil Mitchell, David McNeill, Michael Bain, Mervyn Armstrong, Paul Baine

Research output: Contribution to conference › Paper

Original language	English
Publication status	Published - Jul 2012
Event	Silicon 2012 - St Petersburg, Russian Federation Duration: 09 Jul 2012 → 13 Jul 2012

Cite this

@conference{5def2f852f984e4f8f1f8f0f1727b4a2,

title = "Investigation of crystalline quality and stress in germanium stripes fabricated by rapid melt growth process",

author = "T.S. Perova and Nurfarina Zainal and D. Adley and Neil Mitchell and David McNeill and Michael Bain and Mervyn Armstrong and Paul Baine",

year = "2012",

month = jul,

language = "English",

note = "Silicon 2012 ; Conference date: 09-07-2012 Through 13-07-2012",

}

TY - CONF

T1 - Investigation of crystalline quality and stress in germanium stripes fabricated by rapid melt growth process

AU - Perova, T.S.

AU - Zainal, Nurfarina

AU - Adley, D.

AU - Mitchell, Neil

AU - McNeill, David

AU - Bain, Michael

AU - Armstrong, Mervyn

AU - Baine, Paul

PY - 2012/7

Y1 - 2012/7

M3 - Paper

T2 - Silicon 2012

Y2 - 9 July 2012 through 13 July 2012

ER -