Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples

J. Wasyluk, P.V. Rainey, T.S. Perova, Neil Mitchell, David McNeill, Harold Gamble, Mervyn Armstrong, Richard Hurley

Research output: Contribution to journalArticle

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)448-454
Number of pages7
JournalJournal of Raman Spectroscopy
Volume43
Issue number3
DOIs
Publication statusPublished - Mar 2012

ASJC Scopus subject areas

  • Spectroscopy
  • Materials Science(all)

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