Investigations of laser-induced damages in fused silica optics using X-ray laser interferometric microscopy

D. Margarone*, B. Rus, M. Kozlová, J. Nejdl, T. Mocek, P. Homer, J. Polan, M. Stupka, K. Cassou, S. Kazamias, J. C. Lagron, D. Ros, C. Danson, S. Hawkes

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


A novel x-ray laser (XRL) application, aimed at understanding the microscopic effects involved in formation of laser-induced damage in optical materials exposed to high-power sub-ns laser pulses, is presented. Standard fused silica substrates with permanent damage threshold below 20 J/ cm 2, when irradiated by 438 nm laser pulses, were probed in situ by a neonlike zinc XRL at 21.2 nm. The probing beamline employed a double Lloyd's mirror x-ray interferometer, used in conjunction with an imaging mirror to achieve magnification of ∼8. In conjunction with an array of in situ optical diagnostics, the main question addressed is whether the damage on the rear surface of the beamsplitter is transient or permanent. The second issue, examined by both the x-ray interferometric microscopy and the optical diagnostics, is whether a local rear-surface modification is associated with nonlinear effects such as self-focusing or filamentation of the damaging laser beam in the bulk.

Original languageEnglish
Article number103103
JournalJournal of Applied Physics
Issue number10
Publication statusPublished - 15 May 2010
Externally publishedYes

Bibliographical note

Funding Information:
This work partially benefited from the project HiPER–Preparotory Phase Study (Project No. 7E08099) of the Czech Ministry of Education, Youth and Sports. Financial support by the access to Research Infrastructures activity in the 6th Framework Programme of the EU, Contract No. RII3-CT-2003-506350, LASERLAB Europe, Czech Academy of Science (Project No. M100100911) as well as by the Centres of Fundamental Research Project No. LC528 of the Czech Ministry of Education, is also gratefully acknowledged.

Copyright 2010 Elsevier B.V., All rights reserved.

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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