Large volume metrology instrument selection and measurability analysis

J. E. Muelaner, B. Cai, P. G. Maropoulos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Metrology processes used in the manufacture of large products include tool setting, product verification and flexible metrology enabled automation. The range of applications and instruments available makes the selection of the appropriate instrument for a given task highly complex. Since metrology is a key manufacturing process it should be considered in the early stages of design. This paper provides an overview of the important selection criteria for typical measurement processes and presents some novel selection strategies. Metrics which can be used to assess measurability are also discussed. A prototype instrument selection and measurability analysis application is presented with discussion of how this can be used as the basis for development of a more sophisticated measurement planning tool.

Original languageEnglish
Title of host publicationProceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
PublisherSpringer Verlag
Pages1027-1041
Number of pages15
ISBN (Print)9783642104299
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event6th CIRP International Conference on Digital Enterprise Technology, DET 2009 - Hong Kong, Hong Kong
Duration: 14 Dec 200916 Dec 2009

Publication series

NameAdvances in Intelligent and Soft Computing
Volume66 AISC
ISSN (Print)1867-5662

Conference

Conference6th CIRP International Conference on Digital Enterprise Technology, DET 2009
Country/TerritoryHong Kong
CityHong Kong
Period14/12/200916/12/2009

Keywords

  • Large volume metrology
  • Measurability analysis
  • Process classification
  • Process modelling

ASJC Scopus subject areas

  • General Computer Science

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