Laser-accelerated ion beam diagnostics with TOF detectors for the ELIMED beam line

G. Milluzzo*, V. Scuderi, A. G. Amico, M. Borghesi, G A P Cirrone, G. Cuttone, M. De Napoli, D. Doria, J. Dostal, G. Larosa, R. Leanza, D. Margarone, G. Petringa, J. Pipek, L. Romagnani, F Romano, F. Schillaci, A. Velyhan

*Corresponding author for this work

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