Markov process reliability model for photovoltaic module encapsulation failures

Loredana Cristaldi, Mohamed Khalil, Marco Faifer, Payam Soulatiantork

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This paper presents Markov reliability model of Photovoltaic module encapsulation. The model includes all the possible failures associated with the operation of PV module. The same procedure of modeling can be extended to other parts of Photovoltaic systems. Firstly, failure causes are identified in details to develop the model, and then all the possible states of the encapsulation during the service are considered. Finally a complete Markov process is attained to assess the probability of each state and estimate the encapsulation mean time to failure, probability density function of the time to encapsulation failure, hazard and survival functions of PV module encapsulation.

Original languageEnglish
Title of host publication2015 International Conference on Renewable Energy Research and Applications, ICRERA 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages203-208
Number of pages6
ISBN (Electronic)9781479999828
DOIs
Publication statusPublished - 2015
Externally publishedYes
Event4th International Conference on Renewable Energy Research and Applications, ICRERA 2015 - Palermo, Italy
Duration: 22 Nov 201525 Nov 2015

Conference

Conference4th International Conference on Renewable Energy Research and Applications, ICRERA 2015
CountryItaly
CityPalermo
Period22/11/201525/11/2015

Keywords

  • Markov process
  • Mean time to failure
  • Photovoltaic module encapsulation
  • Reliability

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment

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