Measurement method and apparatus for analysing the metal or metal ion conten of a sample

Konstantinos Christidis (Inventor), Kenneth Gow (Inventor), Peter Robertson (Inventor), Patricia Pollard (Inventor)

Research output: Patent

Abstract

2. K. Gow, P.K.J Robertson, P.M. Pollard, and K. Christidis
Original languageEnglish
Patent numberWO2007007078 A3
IPCG01N27/48, G01N27/42, G01N33/24
Priority date08/07/2005
Publication statusPublished - 18 May 2007

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