Metamaterial in Planar Technology Exhibiting Negative Refractive Index for Arbitrary Incident Plane Wave Polarization

A. Vallecchi, F. Capolino, Alexander Schuchinsky

Research output: Contribution to conferencePaper

Original languageEnglish
Pages429.6-429.6
Number of pages1
DOIs
Publication statusPublished - Jul 2008
Event2008 IEEE AP-S Int. Symp./URSI Meeting - San Diego, United States
Duration: 01 Jul 200801 Jul 2008

Conference

Conference2008 IEEE AP-S Int. Symp./URSI Meeting
CountryUnited States
CitySan Diego
Period01/07/200801/07/2008

Cite this

Vallecchi, A., Capolino, F., & Schuchinsky, A. (2008). Metamaterial in Planar Technology Exhibiting Negative Refractive Index for Arbitrary Incident Plane Wave Polarization. 429.6-429.6. Paper presented at 2008 IEEE AP-S Int. Symp./URSI Meeting, San Diego, United States. https://doi.org/10.1109/APS.2008.4619738