Microcontroller based double beam modulation system for atomic scattering experiments

R.W. O'Neill, Jason Greenwood, M.L. Gradziel, Ian Williams

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Double beam modulation is widely used in atomic collision experiments in the case where the noise arising froth each of the beams exceeds the measured signal. A method for minimizing the statistical uncertainty in a measured signal in a given time period is discussed, and a flexible modulation and counting system based on a low cost PIC microcontroller is described. This device is capable of modifying the acquisition parameters in real time during the course of an experimental run. It is shown that typical savings in data acquisition time of approximately 30% can be achieved using this optimized modulation scheme.
Original languageEnglish
Pages (from-to)1480-1485
Number of pages6
JournalMeasurement Science and Technology
Volume12
Publication statusPublished - Jun 2001

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