@inproceedings{ac0b8b4beb1240c59b5e584693e8c414,
title = "Microstructure and dielectric properties of epitaxial BaTiO3 films and BaTiO3/SrTiO3 multilayers",
abstract = "Epitaxial BaTiO3 films and BaTiO3/SrTiO3 multilayers were grown by pulsed laser deposition (PLD) on (001)-oriented Nb-doped SrTiO3 (SrTiO3:Nb) substrates. Measurements of the dielectric properties were performed comparing BaTiO3 films and BaTiO3/SrTiO3 multilayers of different number of individual layers, but equal overall thickness. The dielectric loss saturates for a thickness above 300 nm, and linearly decreases with decreasing film thickness below a thickness of 75 nm, and it is independent on the number of multilayers, pointing to some interface effect. The thickness dependence of the dielectric constant of BaTiO3 films and BaTiO3/SrTiO3 multilayers; exhibits a change in the linear slope at a thickness of 75 nm. This behavior is explained by the change observed in the morphology at a thickness of 75 nm. In order to explain the thickness dependence of the dielectric constant, two approaches are considered in this paper, viz. a {"}series capacitor{"} model and a {"}dead layer{"} model.",
author = "Alina Visinoiu and Marin Alexe and R Scholtz and Dietrich Hesse",
year = "2003",
language = "English",
volume = "748",
series = "FERROELECTRIC THIN FILMS XI",
publisher = " Book Series: MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS ",
pages = "387",
booktitle = "MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS",
}