Microstructure and dielectric properties of epitaxial BaTiO3 films and BaTiO3/SrTiO3 multilayers

Alina Visinoiu, Marin Alexe, R Scholtz, Dietrich Hesse

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Epitaxial BaTiO3 films and BaTiO3/SrTiO3 multilayers were grown by pulsed laser deposition (PLD) on (001)-oriented Nb-doped SrTiO3 (SrTiO3:Nb) substrates. Measurements of the dielectric properties were performed comparing BaTiO3 films and BaTiO3/SrTiO3 multilayers of different number of individual layers, but equal overall thickness. The dielectric loss saturates for a thickness above 300 nm, and linearly decreases with decreasing film thickness below a thickness of 75 nm, and it is independent on the number of multilayers, pointing to some interface effect. The thickness dependence of the dielectric constant of BaTiO3 films and BaTiO3/SrTiO3 multilayers; exhibits a change in the linear slope at a thickness of 75 nm. This behavior is explained by the change observed in the morphology at a thickness of 75 nm. In order to explain the thickness dependence of the dielectric constant, two approaches are considered in this paper, viz. a "series capacitor" model and a "dead layer" model.
Original languageEnglish
Title of host publicationMATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
Subtitle of host publicationFERROELECTRIC THIN FILMS XI
Pages387
Volume748
Publication statusPublished - 2003

Publication series

NameFERROELECTRIC THIN FILMS XI
Publisher Book Series: MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
Volume748
ISSN (Print)0272-9172

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