Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators

Dmitry Zelenchuk, Vincent Fusco, George Goussetis, Antonio Mendez, David Linton

Research output: Contribution to journalArticlepeer-review

36 Citations (Scopus)


This paper proposes a substrate integrated waveguide
(SIW) cavity-based method that is compliant with
ground-signal–ground (GSG) probing technology for dielectric
characterization of printed circuit board materials at millimeter
wavelengths. This paper presents the theory necessary to retrieve
dielectric parameters from the resonant characteristics of SIW
cavities with particular attention placed on the coupling scheme
and means for obtaining the unloaded resonant frequency. Different
sets of samples are designed and measured to address the
influence of the manufacturing process on the method. Material
parameters are extracted at - and -band from measured data
with the effect of surface roughness of the circuit metallization
taken into account.
Original languageEnglish
Article number6287615
Pages (from-to)3300-3308
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number10
Publication statusPublished - 2012


  • dielectric characterisation
  • Ground Signal Ground (GSG) probing
  • millimetre wave measurement
  • resonators
  • substrate integrated waveguide (SIW)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Radiation


Dive into the research topics of 'Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators'. Together they form a unique fingerprint.

Cite this