Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators

Dmitry Zelenchuk, Vincent Fusco, George Goussetis, Antonio Mendez, David Linton

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

This paper proposes a substrate integrated waveguide
(SIW) cavity-based method that is compliant with
ground-signal–ground (GSG) probing technology for dielectric
characterization of printed circuit board materials at millimeter
wavelengths. This paper presents the theory necessary to retrieve
dielectric parameters from the resonant characteristics of SIW
cavities with particular attention placed on the coupling scheme
and means for obtaining the unloaded resonant frequency. Different
sets of samples are designed and measured to address the
influence of the manufacturing process on the method. Material
parameters are extracted at - and -band from measured data
with the effect of surface roughness of the circuit metallization
taken into account.
LanguageEnglish
Article number6287615
Pages3300-3308
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume60
Issue number10
DOIs
Publication statusPublished - 2012

Fingerprint

Substrate integrated waveguides
printed circuits
circuit boards
Millimeter waves
Printed circuit boards
millimeter waves
resonant frequencies
Resonators
Natural frequencies
surface roughness
manufacturing
Surface roughness
resonators
waveguides
cavities
Networks (circuits)

Keywords

  • dielectric characterisation
  • Ground Signal Ground (GSG) probing
  • millimetre wave measurement
  • resonators
  • substrate integrated waveguide (SIW)

Cite this

@article{3ef0316ff7cf4d099ff15c9a1b283fd8,
title = "Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators",
abstract = "This paper proposes a substrate integrated waveguide(SIW) cavity-based method that is compliant withground-signal–ground (GSG) probing technology for dielectriccharacterization of printed circuit board materials at millimeterwavelengths. This paper presents the theory necessary to retrievedielectric parameters from the resonant characteristics of SIWcavities with particular attention placed on the coupling schemeand means for obtaining the unloaded resonant frequency. Differentsets of samples are designed and measured to address theinfluence of the manufacturing process on the method. Materialparameters are extracted at - and -band from measured datawith the effect of surface roughness of the circuit metallizationtaken into account.",
keywords = "dielectric characterisation, Ground Signal Ground (GSG) probing, millimetre wave measurement, resonators, substrate integrated waveguide (SIW)",
author = "Dmitry Zelenchuk and Vincent Fusco and George Goussetis and Antonio Mendez and David Linton",
year = "2012",
doi = "10.1109/TMTT.2012.2209438",
language = "English",
volume = "60",
pages = "3300--3308",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "10",

}

Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators. / Zelenchuk, Dmitry; Fusco, Vincent; Goussetis, George; Mendez, Antonio; Linton, David.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 60, No. 10, 6287615, 2012, p. 3300-3308.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Millimeter-wave printed circuit board characterization using substrate integrated waveguide resonators

AU - Zelenchuk, Dmitry

AU - Fusco, Vincent

AU - Goussetis, George

AU - Mendez, Antonio

AU - Linton, David

PY - 2012

Y1 - 2012

N2 - This paper proposes a substrate integrated waveguide(SIW) cavity-based method that is compliant withground-signal–ground (GSG) probing technology for dielectriccharacterization of printed circuit board materials at millimeterwavelengths. This paper presents the theory necessary to retrievedielectric parameters from the resonant characteristics of SIWcavities with particular attention placed on the coupling schemeand means for obtaining the unloaded resonant frequency. Differentsets of samples are designed and measured to address theinfluence of the manufacturing process on the method. Materialparameters are extracted at - and -band from measured datawith the effect of surface roughness of the circuit metallizationtaken into account.

AB - This paper proposes a substrate integrated waveguide(SIW) cavity-based method that is compliant withground-signal–ground (GSG) probing technology for dielectriccharacterization of printed circuit board materials at millimeterwavelengths. This paper presents the theory necessary to retrievedielectric parameters from the resonant characteristics of SIWcavities with particular attention placed on the coupling schemeand means for obtaining the unloaded resonant frequency. Differentsets of samples are designed and measured to address theinfluence of the manufacturing process on the method. Materialparameters are extracted at - and -band from measured datawith the effect of surface roughness of the circuit metallizationtaken into account.

KW - dielectric characterisation

KW - Ground Signal Ground (GSG) probing

KW - millimetre wave measurement

KW - resonators

KW - substrate integrated waveguide (SIW)

U2 - 10.1109/TMTT.2012.2209438

DO - 10.1109/TMTT.2012.2209438

M3 - Article

VL - 60

SP - 3300

EP - 3308

JO - IEEE Transactions on Microwave Theory and Techniques

T2 - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 10

M1 - 6287615

ER -