Millimetre wave dielectric characterisation of multilayer LTCC substrate

Dmitry Zelenchuk, Vincent Fusco, James Breslin, Mike Keaveney

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Abstract

The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz – 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.
Original languageEnglish
Title of host publicationProceedings of the 45th European Microwave Conference
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1033-1036
Number of pages4
ISBN (Print)978-2-8748-7039-2
DOIs
Publication statusPublished - 03 Dec 2015
Event2015 European Microwave Week (EuMC) - Paris, France
Duration: 07 Sep 201510 Sep 2015

Conference

Conference2015 European Microwave Week (EuMC)
CountryFrance
CityParis
Period07/09/201510/09/2015

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  • Cite this

    Zelenchuk, D., Fusco, V., Breslin, J., & Keaveney, M. (2015). Millimetre wave dielectric characterisation of multilayer LTCC substrate. In Proceedings of the 45th European Microwave Conference (pp. 1033-1036). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/EuMC.2015.7345943