Millimetre wave dielectric characterisation of multilayer LTCC substrate

Dmitry Zelenchuk; Vincent Fusco; James Breslin; Mike Keaveney

doi:10.1109/EuMC.2015.7345943

Millimetre wave dielectric characterisation of multilayer LTCC substrate

Dmitry Zelenchuk
, Vincent Fusco
, James Breslin
, Mike Keaveney

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

624 Downloads (Pure)

Abstract

The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz – 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.

Original language	English
Title of host publication	Proceedings of the 45th European Microwave Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1033-1036
Number of pages	4
ISBN (Print)	978-2-8748-7039-2
DOIs	https://doi.org/10.1109/EuMC.2015.7345943
Publication status	Published - 03 Dec 2015
Event	2015 European Microwave Week (EuMC) - Paris, France Duration: 07 Sept 2015 → 10 Sept 2015

Conference

Conference	2015 European Microwave Week (EuMC)
Country/Territory	France
City	Paris
Period	07/09/2015 → 10/09/2015

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Millimetre wave dielectric characterisation of multilayer LTCC substrate
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Accepted author manuscript, 716 KBLicence: Unspecified

http://www.eumweek.com/conferences/eumc.html

Dmitry Zelenchuk
- d.zelenchukqub.acuk
- School of Electronics, Electrical Engineering and Computer Science - Senior Lecturer
- High Frequency Electronic Circuits
Person: Academic

Cite this

@inproceedings{dc4e7b5477d849be8af35373d1c5d804,

title = "Millimetre wave dielectric characterisation of multilayer LTCC substrate",

abstract = "The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz {\textendash} 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.",

author = "Dmitry Zelenchuk and Vincent Fusco and James Breslin and Mike Keaveney",

year = "2015",

month = dec,

day = "3",

doi = "10.1109/EuMC.2015.7345943",

language = "English",

isbn = "978-2-8748-7039-2",

pages = "1033--1036",

booktitle = "Proceedings of the 45th European Microwave Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "2015 European Microwave Week (EuMC) ; Conference date: 07-09-2015 Through 10-09-2015",

}

TY - GEN

T1 - Millimetre wave dielectric characterisation of multilayer LTCC substrate

AU - Zelenchuk, Dmitry

AU - Fusco, Vincent

AU - Breslin, James

AU - Keaveney, Mike

PY - 2015/12/3

Y1 - 2015/12/3

N2 - The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz – 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.

AB - The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz – 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.

U2 - 10.1109/EuMC.2015.7345943

DO - 10.1109/EuMC.2015.7345943

M3 - Conference contribution

SN - 978-2-8748-7039-2

SP - 1033

EP - 1036

BT - Proceedings of the 45th European Microwave Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2015 European Microwave Week (EuMC)

Y2 - 7 September 2015 through 10 September 2015

ER -

Millimetre wave dielectric characterisation of multilayer LTCC substrate

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Dmitry Zelenchuk

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