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Monitoring microstructure evolution in TiAl using TEM

  • T. Novoselova
  • , Savko Malinov
  • , Wei Sha
  • , T.S. Rong

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1032-1033
Number of pages2
JournalMicroscopy and Microanalysis
Volume12 (Supplement S2)
Issue numberSUPPL. 2
Publication statusPublished - Aug 2006

ASJC Scopus subject areas

  • Instrumentation

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