Monodomain strained ferroelectric PbTiO(3) thin films: Phase transition and critical thickness study

Sriram Venkatesan, Ard Vlooswijk, Bart J. Kooi*, Alessio Morelli, George Palasantzas, Jeff T. M. De Hosson, Beatriz Noheda

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

39 Citations (Scopus)


This work demonstrates that instead of paraelectric PbTiO(3), completely c-oriented ferroelectric PbTiO(3) thin films were directly grown on (001)-SrTiO(3) substrates by pulsed-laser deposition with thickness up to 340 nm at a temperature well above the Curie temperature of bulk PbTiO(3). The influence of laser-pulse frequency, substrate-surface termination on growth, and functional properties were studied using x-ray diffraction, transmission electron microscopy, and piezoresponse force microscopy. At low growth rates (frequency 8 Hz) a domains were formed for film thickness above 20-100 nm. Due to coherency strains the Curie temperature (T(c)) of the monodomain films was increased approximately by 350 degrees C with respect to the T(c) of bulk PbTiO(3) even for 280-nm-thick films. Nonetheless, up to now this type of growth mode has been considered unlikely to occur since the Matthews-Blakeslee (MB) model already predicts strain relaxation for films having a thickness of only similar to 10 nm. However, the present work disputes the applicability of the MB model. It clarifies the physical reasons for the large increase in T(c) for thick films, and it is shown that the experimental results are in good agreement with the predictions based on the monodomain model of Pertsev et al. [Phys. Rev. Lett. 80, 1988 (1998)].

Original languageEnglish
Article number104112
Number of pages8
JournalPhysical Review B (Condensed Matter)
Issue number10
Publication statusPublished - Sept 2008




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