New techniques for the measurement of x-ray beam or x-ray optics quality

P. Zeitoun; P. Balcou; S. Bucourt; D. Benredjem; F. Delmotte; G. Dovillaire; D. Douillet; J. Dunn; G. Faivre; M. Fajardo; K.A. Goldberg; M. Idir; S. Hubert; J.R. Hunter; S. Jacquemot; S. Kazamias; S. Le Pape; X. Levecq; Ciaran Lewis; R. Marmoret; P. Mercere; A.S. Morlens; P.P. Naulleau; C. Remond; J.J. Rocca; S. Sebban; R.F. Smith; M.F. Ravet; P. Troussel; C. Valentin; L. Vanbostal

New techniques for the measurement of x-ray beam or x-ray optics quality

P. Zeitoun, P. Balcou, S. Bucourt, D. Benredjem, F. Delmotte, G. Dovillaire, D. Douillet, J. Dunn, G. Faivre, M. Fajardo, K.A. Goldberg, M. Idir, S. Hubert, J.R. Hunter, S. Jacquemot, S. Kazamias, S. Le Pape, X. Levecq, Ciaran Lewis, R. MarmoretP. Mercere, A.S. Morlens, P.P. Naulleau, C. Remond, J.J. Rocca, S. Sebban, R.F. Smith, M.F. Ravet, P. Troussel, C. Valentin, L. Vanbostal

Research output: Contribution to conference › Paper

1 Citation (Scopus)

Original language	English
Pages	194-204
Number of pages	11
Publication status	Published - Aug 2003
Event	Conference on Soft X-ray Lasers and Applications V - San Diego, Ca, United States Duration: 01 Aug 2003 → 01 Aug 2003

Conference

Conference	Conference on Soft X-ray Lasers and Applications V
Country/Territory	United States
City	San Diego, Ca
Period	01/08/2003 → 01/08/2003

Cite this

Zeitoun, P., Balcou, P., Bucourt, S., Benredjem, D., Delmotte, F., Dovillaire, G., Douillet, D., Dunn, J., Faivre, G., Fajardo, M., Goldberg, K. A., Idir, M., Hubert, S., Hunter, J. R., Jacquemot, S., Kazamias, S., Le Pape, S., Levecq, X., Lewis, C., ... Vanbostal, L. (2003). New techniques for the measurement of x-ray beam or x-ray optics quality. 194-204. Paper presented at Conference on Soft X-ray Lasers and Applications V, San Diego, Ca, United States.

Zeitoun, P. ; Balcou, P. ; Bucourt, S. ; Benredjem, D. ; Delmotte, F. ; Dovillaire, G. ; Douillet, D. ; Dunn, J. ; Faivre, G. ; Fajardo, M. ; Goldberg, K.A. ; Idir, M. ; Hubert, S. ; Hunter, J.R. ; Jacquemot, S. ; Kazamias, S. ; Le Pape, S. ; Levecq, X. ; Lewis, Ciaran ; Marmoret, R. ; Mercere, P. ; Morlens, A.S. ; Naulleau, P.P. ; Remond, C. ; Rocca, J.J. ; Sebban, S. ; Smith, R.F. ; Ravet, M.F. ; Troussel, P. ; Valentin, C. ; Vanbostal, L. / New techniques for the measurement of x-ray beam or x-ray optics quality. Paper presented at Conference on Soft X-ray Lasers and Applications V, San Diego, Ca, United States.11 p.

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title = "New techniques for the measurement of x-ray beam or x-ray optics quality",

author = "P. Zeitoun and P. Balcou and S. Bucourt and D. Benredjem and F. Delmotte and G. Dovillaire and D. Douillet and J. Dunn and G. Faivre and M. Fajardo and K.A. Goldberg and M. Idir and S. Hubert and J.R. Hunter and S. Jacquemot and S. Kazamias and {Le Pape}, S. and X. Levecq and Ciaran Lewis and R. Marmoret and P. Mercere and A.S. Morlens and P.P. Naulleau and C. Remond and J.J. Rocca and S. Sebban and R.F. Smith and M.F. Ravet and P. Troussel and C. Valentin and L. Vanbostal",

year = "2003",

month = aug,

language = "English",

pages = "194--204",

note = "Conference on Soft X-ray Lasers and Applications V ; Conference date: 01-08-2003 Through 01-08-2003",

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Zeitoun, P, Balcou, P, Bucourt, S, Benredjem, D, Delmotte, F, Dovillaire, G, Douillet, D, Dunn, J, Faivre, G, Fajardo, M, Goldberg, KA, Idir, M, Hubert, S, Hunter, JR, Jacquemot, S, Kazamias, S, Le Pape, S, Levecq, X, Lewis, C, Marmoret, R, Mercere, P, Morlens, AS, Naulleau, PP, Remond, C, Rocca, JJ, Sebban, S, Smith, RF, Ravet, MF, Troussel, P, Valentin, C & Vanbostal, L 2003, 'New techniques for the measurement of x-ray beam or x-ray optics quality', Paper presented at Conference on Soft X-ray Lasers and Applications V, San Diego, Ca, United States, 01/08/2003 - 01/08/2003 pp. 194-204.

New techniques for the measurement of x-ray beam or x-ray optics quality. / Zeitoun, P.; Balcou, P.; Bucourt, S.; Benredjem, D.; Delmotte, F.; Dovillaire, G.; Douillet, D.; Dunn, J.; Faivre, G.; Fajardo, M.; Goldberg, K.A.; Idir, M.; Hubert, S.; Hunter, J.R.; Jacquemot, S.; Kazamias, S.; Le Pape, S.; Levecq, X.; Lewis, Ciaran; Marmoret, R.; Mercere, P.; Morlens, A.S.; Naulleau, P.P.; Remond, C.; Rocca, J.J.; Sebban, S.; Smith, R.F.; Ravet, M.F.; Troussel, P.; Valentin, C.; Vanbostal, L.

2003. 194-204 Paper presented at Conference on Soft X-ray Lasers and Applications V, San Diego, Ca, United States.

Research output: Contribution to conference › Paper

TY - CONF

T1 - New techniques for the measurement of x-ray beam or x-ray optics quality

AU - Zeitoun, P.

AU - Balcou, P.

AU - Bucourt, S.

AU - Benredjem, D.

AU - Delmotte, F.

AU - Dovillaire, G.

AU - Douillet, D.

AU - Dunn, J.

AU - Faivre, G.

AU - Fajardo, M.

AU - Goldberg, K.A.

AU - Idir, M.

AU - Hubert, S.

AU - Hunter, J.R.

AU - Jacquemot, S.

AU - Kazamias, S.

AU - Le Pape, S.

AU - Levecq, X.

AU - Lewis, Ciaran

AU - Marmoret, R.

AU - Mercere, P.

AU - Morlens, A.S.

AU - Naulleau, P.P.

AU - Remond, C.

AU - Rocca, J.J.

AU - Sebban, S.

AU - Smith, R.F.

AU - Ravet, M.F.

AU - Troussel, P.

AU - Valentin, C.

AU - Vanbostal, L.

PY - 2003/8

Y1 - 2003/8

M3 - Paper

SP - 194

EP - 204

T2 - Conference on Soft X-ray Lasers and Applications V

Y2 - 1 August 2003 through 1 August 2003

ER -