Non-destructive characterization for dielectric loss of low permittivity substrate materials

X.Y. Fang, David Linton, C. Walker, B. Collins

Research output: Contribution to conference › Paper

Original language	English
Pages	747-754
Number of pages	8
DOIs	https://doi.org/10.1088/0957-0233/15/4/019
Publication status	Published - May 2004
Event	International Workshop on Holographic Metrology in Fluid Mechanics - Loughborough Univ, Loughborough, England, United Kingdom Duration: 01 May 2004 → 01 May 2004

Conference	International Workshop on Holographic Metrology in Fluid Mechanics
Country/Territory	United Kingdom
City	Loughborough, England
Period	01/05/2004 → 01/05/2004

Access to Document

@conference{274296fbdc0e49bbb32aa2f5d7d78165,

title = "Non-destructive characterization for dielectric loss of low permittivity substrate materials",

author = "X.Y. Fang and David Linton and C. Walker and B. Collins",

year = "2004",

month = may,

doi = "10.1088/0957-0233/15/4/019",

language = "English",

pages = "747--754",

note = "International Workshop on Holographic Metrology in Fluid Mechanics ; Conference date: 01-05-2004 Through 01-05-2004",

}

TY - CONF

T1 - Non-destructive characterization for dielectric loss of low permittivity substrate materials

AU - Fang, X.Y.

AU - Linton, David

AU - Walker, C.

AU - Collins, B.

PY - 2004/5

Y1 - 2004/5

U2 - 10.1088/0957-0233/15/4/019

DO - 10.1088/0957-0233/15/4/019

M3 - Paper

SP - 747

EP - 754

T2 - International Workshop on Holographic Metrology in Fluid Mechanics

Y2 - 1 May 2004 through 1 May 2004

ER -