Abstract
A simple creep testing method is presented which involves using coiled specimens. With this method, a single experiment can give all the data required for a plot of strain rate versus stress. The value of the stress-exponent of room temperature steady-state creep a Pb-61.5wt% Sn solder was measured in this way to be 1.06, as expected from a diffusion creep mechanism.
| Original language | English |
|---|---|
| Pages (from-to) | 106-109 |
| Number of pages | 4 |
| Journal | Rare Metals |
| Volume | 15 |
| Issue number | 2 |
| Publication status | Published - 01 Apr 1996 |
ASJC Scopus subject areas
- General Materials Science
- Metals and Alloys
Fingerprint
Dive into the research topics of 'Novel and simple creep testing method and its application in measuring the creep of solder'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver