Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

C. Gatel; A. Masseboeuf; E. Snoeck; F. Bonilla; T. Blon; L. M. Lacroix; A Meffre; J. F. Einsle; R. M. Bowman; M. A. Bashir; M. Gubbins

Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

C. Gatel, A. Masseboeuf, E. Snoeck, F. Bonilla, T. Blon, L. M. Lacroix, A Meffre, J. F. Einsle, R. M. Bowman, M. A. Bashir, M. Gubbins

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2147-2148
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	21
Issue number	Suppl 3
Publication status	Published - Aug 2015

Cite this

@article{325ec6e39a4b4676a9ece0871240d7c7,

title = "Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device",

author = "C. Gatel and A. Masseboeuf and E. Snoeck and F. Bonilla and T. Blon and Lacroix, {L. M.} and A Meffre and Einsle, {J. F.} and Bowman, {R. M.} and Bashir, {M. A.} and M. Gubbins",

year = "2015",

month = aug,

language = "English",

volume = "21",

pages = "2147--2148",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl 3",

}

TY - JOUR

T1 - Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

AU - Gatel, C.

AU - Masseboeuf, A.

AU - Snoeck, E.

AU - Bonilla, F.

AU - Blon, T.

AU - Lacroix, L. M.

AU - Meffre, A

AU - Einsle, J. F.

AU - Bowman, R. M.

AU - Bashir, M. A.

AU - Gubbins, M.

PY - 2015/8

Y1 - 2015/8

M3 - Article

VL - 21

SP - 2147

EP - 2148

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - Suppl 3

ER -