On Passive Intermodulation Test of Analog and Digital Systems

Dmitry Kozlov, Alexey Shitvov, Alexander Schuchinsky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
567 Downloads (Pure)

Abstract

This paper presents initial results of evaluating suitability of the conventional two-tone CW passive intermodulation (PIM) test for characterization of modulated signal distortion by passive nonlinearities in base station antennas and RF front-end. A comprehensive analysis of analog and digitally modulated waveforms in the transmission lines with weak distributed nonlinearity has been performed using the harmonic balance analysis and X-parameters in Advanced Design System (ADS) simulator. The nonlinear distortion metrics used in the conventional two-tone CW PIM test have been compared with the respective spectral metrics applied to the modulated waveforms, such as adjacent channel power ratio (ACPR) and error vector magnitude (EVM). It is shown that the results of two-tone CW PIM tests are consistent with the metrics used for assessment of signal integrity of both analog and digitally modulated waveforms.
Original languageEnglish
Title of host publication2015 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC)
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages3
ISBN (Print)9781467364966
DOIs
Publication statusPublished - 2015
EventThe International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits - Sicily, Taormina, Italy
Duration: 01 Oct 201502 Oct 2015

Conference

ConferenceThe International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits
Country/TerritoryItaly
CityTaormina
Period01/10/201502/10/2015

Keywords

  • Communication nonlinearities
  • passive intermodulation
  • signal integrity
  • nonlinear distortion

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'On Passive Intermodulation Test of Analog and Digital Systems'. Together they form a unique fingerprint.

Cite this