On the Complexity of Wafer-to-Wafer Integration

Guillerme Duvillié, Marin Bougeret, Vincent Boudet, Trivikram Dokka, Rodolphe Giroudeau

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we consider the Wafer-to-Wafer Integration problem. A wafer is a p -dimensional binary vector. The input of this problem is described by m disjoints sets (called “lots”), where each set contains n wafers. The output of the problem is a set of n disjoint stacks, where a stack is a set of m wafers (one wafer from each lot). To each stack we associate a p -dimensional binary vector corresponding to the bit-wise AND operation of the wafers of the stack. The objective is to maximize the total number of “1” in the n stacks. We provide O(m1−ϵ) and O(p1−ϵ) non-approximability results even for n=2 , as well as a pr -approximation algorithm for any constant r . Finally, we show that the problem is FPT when parameterized by p , and we use this FPT algorithm to improve the running time of the pr -approximation algorithm.
Original languageEnglish
Title of host publicationAlgorithms and Complexity. 9th International Conference, CIAC 2015, Paris, France, May 20-22, 2015. Proceedings
EditorsVangelis Th. Paschos, Peter Widmayer
PublisherSpringer
Pages208-220
ISBN (Electronic)978-3-319-18173-8
DOIs
Publication statusPublished - 16 May 2015
Externally publishedYes

Publication series

NameLecture Notes in Computer Science
Volume9079
ISSN (Print)0302-9743

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