On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon

Georgios Karakonstantis; Christoph Roth; Christian Benkeser; Andreas Burg

On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon

Georgios Karakonstantis^*, Christoph Roth, Christian Benkeser, Andreas Burg

^*Corresponding author for this work

School of Electronics, Electrical Engineering and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

18 Citations (Scopus)

Abstract

In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.

Original language	English
Title of host publication	2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC)
Place of Publication	NEW YORK
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	510-515
Number of pages	6
Publication status	Published - 2012
Event	49th ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, Canada Duration: 03 Jun 2012 → 07 Jun 2012

Publication series

Name	Design Automation Conference DAC
Publisher	IEEE
ISSN (Print)	0738-100X

Conference

Conference	49th ACM/EDAC/IEEE Design Automation Conference (DAC)
Country/Territory	Canada
Period	03/06/2012 → 07/06/2012

Keywords

Error-Resiliency
Memory Failures
Wireless Communication Systems
Energy-Efficiency
Reliability
Yield

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

@inproceedings{47f63b5bb2064a6db02e4055b64d4553,

title = "On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon",

abstract = "In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.",

keywords = "Error-Resiliency, Memory Failures, Wireless Communication Systems, Energy-Efficiency, Reliability, Yield",

author = "Georgios Karakonstantis and Christoph Roth and Christian Benkeser and Andreas Burg",

year = "2012",

language = "English",

series = "Design Automation Conference DAC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "510--515",

booktitle = "2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC)",

address = "United States",

note = "49th ACM/EDAC/IEEE Design Automation Conference (DAC) ; Conference date: 03-06-2012 Through 07-06-2012",

}

Karakonstantis, G, Roth, C, Benkeser, C & Burg, A 2012, On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon. in 2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC). Design Automation Conference DAC, Institute of Electrical and Electronics Engineers Inc., NEW YORK, pp. 510-515, 49th ACM/EDAC/IEEE Design Automation Conference (DAC), Canada, 03/06/2012.

On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon. / Karakonstantis, Georgios; Roth, Christoph; Benkeser, Christian et al.
2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC). NEW YORK: Institute of Electrical and Electronics Engineers Inc., 2012. p. 510-515 (Design Automation Conference DAC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon

AU - Karakonstantis, Georgios

AU - Roth, Christoph

AU - Benkeser, Christian

AU - Burg, Andreas

PY - 2012

Y1 - 2012

N2 - In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.

AB - In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.

KW - Error-Resiliency

KW - Memory Failures

KW - Wireless Communication Systems

KW - Energy-Efficiency

KW - Reliability

KW - Yield

M3 - Conference contribution

T3 - Design Automation Conference DAC

SP - 510

EP - 515

BT - 2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC)

PB - Institute of Electrical and Electronics Engineers Inc.

CY - NEW YORK

T2 - 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

Y2 - 3 June 2012 through 7 June 2012

ER -

On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon

Abstract

Publication series

Conference

Keywords

UN SDGs

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