On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon

Georgios Karakonstantis*, Christoph Roth, Christian Benkeser, Andreas Burg

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Citations (Scopus)

Abstract

In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.

Original languageEnglish
Title of host publication2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC)
Place of PublicationNEW YORK
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages510-515
Number of pages6
Publication statusPublished - 2012
Event49th ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, Canada
Duration: 03 Jun 201207 Jun 2012

Publication series

NameDesign Automation Conference DAC
PublisherIEEE
ISSN (Print)0738-100X

Conference

Conference49th ACM/EDAC/IEEE Design Automation Conference (DAC)
CountryCanada
Period03/06/201207/06/2012

Keywords

  • Error-Resiliency
  • Memory Failures
  • Wireless Communication Systems
  • Energy-Efficiency
  • Reliability
  • Yield

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