On wafer broadband measurement for substrate material characterisation

Zhiguo Ding, David Linton

Research output: Contribution to conference › Paper

Original language	English
Pages	674-678
Number of pages	5
Publication status	Published - Sept 2006
Event	1st Electronics Systemintegration Technology Conference - Dresden, Germany Duration: 01 Sept 2006 → 01 Sept 2006

Conference	1st Electronics Systemintegration Technology Conference
Country/Territory	Germany
City	Dresden
Period	01/09/2006 → 01/09/2006

Cite this

@conference{799b25141dfd47c6bba60b4dbfdf39f4,

title = "On wafer broadband measurement for substrate material characterisation",

author = "Zhiguo Ding and David Linton",

year = "2006",

month = sep,

language = "English",

pages = "674--678",

note = "1st Electronics Systemintegration Technology Conference ; Conference date: 01-09-2006 Through 01-09-2006",

}