On wafer broadband measurement for substrate material characterisation

Zhiguo Ding, David Linton

Research output: Contribution to conferencePaper

Original languageEnglish
Pages674-678
Number of pages5
Publication statusPublished - Sep 2006
Event1st Electronics Systemintegration Technology Conference - Dresden, Germany
Duration: 01 Sep 200601 Sep 2006

Conference

Conference1st Electronics Systemintegration Technology Conference
Country/TerritoryGermany
CityDresden
Period01/09/200601/09/2006

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