Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser,

Research output: Contribution to conference › Paper

Original language	English
Pages	73610P-73610P
DOIs	https://doi.org/10.1117/12.822766
Publication status	Published - May 2009
Event	Damage to VUV, EUV and X-ray Optics II, SPIE - Prague, Czech Republic Duration: 01 May 2009 → 01 May 2009

Conference	Damage to VUV, EUV and X-ray Optics II, SPIE
Country/Territory	Czech Republic
City	Prague
Period	01/05/2009 → 01/05/2009

Access to Document

@conference{e9468fe7d69b43678418178c8675c540,

title = "Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser,",

author = "J. Cihelka and David Riley",

year = "2009",

month = may,

doi = "10.1117/12.822766",

language = "English",

pages = "73610P--73610P",

note = "Damage to VUV, EUV and X-ray Optics II, SPIE ; Conference date: 01-05-2009 Through 01-05-2009",

}

TY - CONF

T1 - Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser,

AU - Cihelka, J.

AU - Riley, David

PY - 2009/5

Y1 - 2009/5

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U2 - 10.1117/12.822766

DO - 10.1117/12.822766

M3 - Paper

SP - 73610P-73610P

T2 - Damage to VUV, EUV and X-ray Optics II, SPIE

Y2 - 1 May 2009 through 1 May 2009

ER -