Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser,

J. Cihelka, David Riley, Et Al

Research output: Contribution to conferencePaper

5 Citations (Scopus)
Original languageEnglish
Pages73610P-73610P
DOIs
Publication statusPublished - May 2009
EventDamage to VUV, EUV and X-ray Optics II, SPIE - Prague, Czech Republic
Duration: 01 May 200901 May 2009

Conference

ConferenceDamage to VUV, EUV and X-ray Optics II, SPIE
CountryCzech Republic
CityPrague
Period01/05/200901/05/2009

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