@inproceedings{465c6b436d8748b9a5a30ddcd72ec511,
title = "OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES",
keywords = "SURFACE PLASMON, LOW TEMPERATURE, ATOMIC FORCE MICROSCOPY, RUTHERFORD BACK SCATTERING",
author = "PG MCCAFFERTY and A SELLAI and P DAWSON",
year = "1994",
language = "English",
isbn = "0-8194-1598-7",
series = "PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)",
publisher = "SPIE - The International Society for Optical Engineering",
pages = "55--63",
editor = "RE Longshore",
booktitle = "INFRARED DETECTORS: STATE OF THE ART II",
address = "United States",
note = "Infrared Detectors - State of the Art II Conference ; Conference date: 24-07-1994 Through 25-07-1994",
}