OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES

PG MCCAFFERTY; A SELLAI; P DAWSON

OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES

PG MCCAFFERTY, A SELLAI, P DAWSON

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INFRARED DETECTORS: STATE OF THE ART II
Editors	RE Longshore
Place of Publication	BELLINGHAM
Publisher	SPIE - The International Society for Optical Engineering
Pages	55-63
Number of pages	9
ISBN (Print)	0-8194-1598-7
Publication status	Published - 1994
Event	Infrared Detectors - State of the Art II Conference - SAN DIEGO, Canada Duration: 24 Jul 1994 → 25 Jul 1994

Publication series

Name	PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Publisher	SPIE - INT SOC OPTICAL ENGINEERING
Volume	2274

Conference

Conference	Infrared Detectors - State of the Art II Conference
Country/Territory	Canada
Period	24/07/1994 → 25/07/1994

Keywords

SURFACE PLASMON
LOW TEMPERATURE
ATOMIC FORCE MICROSCOPY
RUTHERFORD BACK SCATTERING

Cite this

@inproceedings{465c6b436d8748b9a5a30ddcd72ec511,

title = "OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES",

keywords = "SURFACE PLASMON, LOW TEMPERATURE, ATOMIC FORCE MICROSCOPY, RUTHERFORD BACK SCATTERING",

author = "PG MCCAFFERTY and A SELLAI and P DAWSON",

year = "1994",

language = "English",

isbn = "0-8194-1598-7",

series = "PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)",

publisher = "SPIE - The International Society for Optical Engineering",

pages = "55--63",

editor = "RE Longshore",

booktitle = "INFRARED DETECTORS: STATE OF THE ART II",

address = "United States",

note = "Infrared Detectors - State of the Art II Conference ; Conference date: 24-07-1994 Through 25-07-1994",

}

MCCAFFERTY, PG, SELLAI, A & DAWSON, P 1994, OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES. in RE Longshore (ed.), INFRARED DETECTORS: STATE OF THE ART II. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), vol. 2274, SPIE - The International Society for Optical Engineering, BELLINGHAM, pp. 55-63, Infrared Detectors - State of the Art II Conference, Canada, 24/07/1994.

OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES. / MCCAFFERTY, PG; SELLAI, A; DAWSON, P.

INFRARED DETECTORS: STATE OF THE ART II. ed. / RE Longshore. BELLINGHAM : SPIE - The International Society for Optical Engineering, 1994. p. 55-63 (PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE); Vol. 2274).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES

AU - MCCAFFERTY, PG

AU - SELLAI, A

AU - DAWSON, P

PY - 1994

Y1 - 1994

KW - SURFACE PLASMON

KW - LOW TEMPERATURE

KW - ATOMIC FORCE MICROSCOPY

KW - RUTHERFORD BACK SCATTERING

M3 - Conference contribution

SN - 0-8194-1598-7

T3 - PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)

SP - 55

EP - 63

BT - INFRARED DETECTORS: STATE OF THE ART II

A2 - Longshore, RE

PB - SPIE - The International Society for Optical Engineering

CY - BELLINGHAM

T2 - Infrared Detectors - State of the Art II Conference

Y2 - 24 July 1994 through 25 July 1994

ER -