OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES

PG MCCAFFERTY, A SELLAI, P DAWSON

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINFRARED DETECTORS: STATE OF THE ART II
EditorsRE Longshore
Place of PublicationBELLINGHAM
PublisherSPIE - INT SOC OPTICAL ENGINEERING
Pages55-63
Number of pages9
ISBN (Print)0-8194-1598-7
Publication statusPublished - 1994
EventInfrared Detectors - State of the Art II Conference - SAN DIEGO, Canada
Duration: 24 Jul 199425 Jul 1994

Publication series

NamePROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
PublisherSPIE - INT SOC OPTICAL ENGINEERING
Volume2274

Conference

ConferenceInfrared Detectors - State of the Art II Conference
CountryCanada
Period24/07/199425/07/1994

Keywords

  • SURFACE PLASMON
  • LOW TEMPERATURE
  • ATOMIC FORCE MICROSCOPY
  • RUTHERFORD BACK SCATTERING

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