Optimizing FinFET Geometry and Parasitics for RF Applications

Abhinav Kranti, J.P. Raskin, Alastair Armstrong

Research output: Contribution to conferencePaper

22 Citations (Scopus)
Original languageEnglish
Pages123-124
Number of pages2
Publication statusPublished - Oct 2008
EventIEEE International SOI Conference - New Platz, Ny, United States
Duration: 01 Oct 200801 Oct 2008

Conference

ConferenceIEEE International SOI Conference
CountryUnited States
CityNew Platz, Ny
Period01/10/200801/10/2008

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