Performance assessment of nanoscale multiple gate MOSFETs (MuGFETs) for RF applications

T.C. Lim, Abhinav Kranti, Alastair Armstrong

Research output: Contribution to conferencePaper

1 Citation (Scopus)
Original languageEnglish
Pages308-311
Number of pages4
Publication statusPublished - Oct 2006
Event1st European Microwave Integrated Circuits Conference - Manchester, United Kingdom
Duration: 01 Oct 200601 Oct 2006

Conference

Conference1st European Microwave Integrated Circuits Conference
CountryUnited Kingdom
CityManchester
Period01/10/200601/10/2006

Cite this

Lim, T. C., Kranti, A., & Armstrong, A. (2006). Performance assessment of nanoscale multiple gate MOSFETs (MuGFETs) for RF applications. 308-311. Paper presented at 1st European Microwave Integrated Circuits Conference, Manchester, United Kingdom.