We report on a study comparing absolute K-alpha yield from Ti foils measured with a calibrated system of an X-ray CCD coupled to a curved LiF Von-Hamos crystal spectrometer to the difference in the signals measured simultaneously with two similar photodiodes fitted with two different filters. Our data indicate that a combination of photodiodes with different filters could be developed into an alternative and inexpensive diagnostic for monitoring single shot pulsed emission in a narrow band of X-ray region.
|Number of pages||4|
|Journal||Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detector|
|Publication status||Published - 21 Dec 2006|
ASJC Scopus subject areas
- Nuclear and High Energy Physics