Abstract
This paper presents the basic physics underlying the operation of electron beam ion traps and sources, with the machine physics underlying their operation being described in some detail. Predictions arising from this description are compared with some diagnostic measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 1763-1777 |
| Number of pages | 15 |
| Journal | IEEE Transactions on Plasma Science |
| Volume | 33 |
| Issue number | 6 I |
| DOIs | |
| Publication status | Published - Dec 2005 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics