Physics of electron beam ion traps and sources

Frederick Currell, G. Fussmann

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)


This paper presents the basic physics underlying the operation of electron beam ion traps and sources, with the machine physics underlying their operation being described in some detail. Predictions arising from this description are compared with some diagnostic measurements.
Original languageEnglish
Pages (from-to)1763-1777
Number of pages15
JournalIEEE Transactions on Plasma Science
Issue number6 I
Publication statusPublished - Dec 2005

ASJC Scopus subject areas

  • General Physics and Astronomy
  • Condensed Matter Physics


Dive into the research topics of 'Physics of electron beam ion traps and sources'. Together they form a unique fingerprint.

Cite this