Physics of electron beam ion traps and sources

Frederick Currell; G. Fussmann

doi:10.1109/TPS.2005.860072

Physics of electron beam ion traps and sources

Frederick Currell, G. Fussmann

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

This paper presents the basic physics underlying the operation of electron beam ion traps and sources, with the machine physics underlying their operation being described in some detail. Predictions arising from this description are compared with some diagnostic measurements.

Original language	English
Pages (from-to)	1763-1777
Number of pages	15
Journal	IEEE Transactions on Plasma Science
Volume	33
Issue number	6 I
DOIs	https://doi.org/10.1109/TPS.2005.860072
Publication status	Published - Dec 2005

ASJC Scopus subject areas

General Physics and Astronomy
Condensed Matter Physics

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Physics of electron beam ion traps and sources

Abstract

ASJC Scopus subject areas

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