Piezoresponse force microscopy of ferroelectric thin films: Frequency dependence of phase imaging

A. Morelli, G. Palasantzas*, J. Th. M. De Hosson

*Corresponding author for this work

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5 Citations (Scopus)


The objective of this work is an evaluation of quantitative measurements of piezoresponse force microscopy for nanoscale characterization of ferroelectric films. To this end, we investigate how the piezoresponse phase difference Delta Phi between c domains depends on the frequency omega of the applied ac field much lower than the cantilever first resonance frequency. The main specimen under study was a 102 nm thick film of Pb(Zr(0.2)Ti(0.8))O(3). For the sake of comparison, a 100 nm thick PbTiO(3) film was also used. From our measurements, we conclude a frequency dependent behavior Delta Phi similar to omega(-1), which can only be partially explained by the presence of adsorbates on the surface. (C) 2008 American Institute of Physics.

Original languageEnglish
Article number114109
Number of pages4
JournalJournal of Applied Physics
Issue number11
Publication statusPublished - 01 Jun 2008



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