Plasma emission spectroscopy of solids irradiated by intense XUV pulses from a free electron laser

T. W. J. Dzelzainis, J. Chalupsky, M. Fajardo, R. Fäustlin, P. A. Heimann, V. Hajkova, L. Juha, M. Jurek, F. Y. Khattak, M. Kozlova, J. Krzywinski, R. W. Lee, B. Nagler, A. J. Nelson, F. B. Rosmej, R. Soberierski, S. Toleikis, T. Tschentscher, S. M. Vinko, J. S. WarkT. Whitcher, D. Riley*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 10(16) W cm(-2) at a wavelength of 13.5 nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the range 5-8 eV with electron density in the range 10(21)-10(22) cm(-3). These results are consistent with the saturation of absorption through bleaching of the L-edge by intense photo-absorption reported in an earlier publication. (C) 2009 Elsevier B.V. All rights reserved.

Original languageEnglish
Pages (from-to)109-112
Number of pages4
JournalHigh Energy Density Physics
Volume6
Issue number1
DOIs
Publication statusPublished - Jan 2010

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Radiation

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