Process monitoring using robust chemometric spectrum models for predicting concentration profiles

Uwe Kruger, Yan Zhou, David W. Rooney, Xun Wang, Jillian M. Thompson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationConference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting
PublisherAIChE
Pages167-168
Number of pages2
ISBN (Print)9781604233636
Publication statusPublished - 2014
EventConference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting - Houston, United States
Duration: 22 Apr 200727 Apr 2007

Conference

ConferenceConference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting
CountryUnited States
CityHouston
Period22/04/200727/04/2007

Cite this

Kruger, U., Zhou, Y., Rooney, D. W., Wang, X., & Thompson, J. M. (2014). Process monitoring using robust chemometric spectrum models for predicting concentration profiles. In Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting (pp. 167-168). AIChE.
Kruger, Uwe ; Zhou, Yan ; Rooney, David W. ; Wang, Xun ; Thompson, Jillian M. / Process monitoring using robust chemometric spectrum models for predicting concentration profiles. Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting. AIChE, 2014. pp. 167-168
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title = "Process monitoring using robust chemometric spectrum models for predicting concentration profiles",
author = "Uwe Kruger and Yan Zhou and Rooney, {David W.} and Xun Wang and Thompson, {Jillian M.}",
year = "2014",
language = "English",
isbn = "9781604233636",
pages = "167--168",
booktitle = "Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting",
publisher = "AIChE",

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Kruger, U, Zhou, Y, Rooney, DW, Wang, X & Thompson, JM 2014, Process monitoring using robust chemometric spectrum models for predicting concentration profiles. in Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting. AIChE, pp. 167-168, Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting, Houston, United States, 22/04/2007.

Process monitoring using robust chemometric spectrum models for predicting concentration profiles. / Kruger, Uwe; Zhou, Yan; Rooney, David W.; Wang, Xun; Thompson, Jillian M.

Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting. AIChE, 2014. p. 167-168.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Process monitoring using robust chemometric spectrum models for predicting concentration profiles

AU - Kruger, Uwe

AU - Zhou, Yan

AU - Rooney, David W.

AU - Wang, Xun

AU - Thompson, Jillian M.

PY - 2014

Y1 - 2014

UR - http://www.scopus.com/inward/record.url?scp=84912059630&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84912059630

SN - 9781604233636

SP - 167

EP - 168

BT - Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting

PB - AIChE

ER -

Kruger U, Zhou Y, Rooney DW, Wang X, Thompson JM. Process monitoring using robust chemometric spectrum models for predicting concentration profiles. In Conference of the Computing and Systems Technology Division 2007, Held at the 2007 AIChE Spring National Meeting. AIChE. 2014. p. 167-168