Process variation tolerant low power DCT architecture

Nilanjan Banerjee*, Georgios Karakonstantis, Kaushik Roy

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

57 Citations (Scopus)

Abstract

2-D Discrete Cosine Transform (DCT) is widely used as the core of digital image and video compression. In this paper, we present a novel DCT architecture that allows aggressive voltage scaling by exploiting the fact that not all intermediate computations are equally important in a DCT system to obtain "good" image quality with Peak Signal to Noise Ratio(PSNR) > 30 dB. This observation has led us to propose a DCT architecture where the signal paths that are less contributive to PSNR improvement are designed to be longer than the paths that are more contributive to PSNR improvement. It should also be noted that robustness with respect to parameter variations and low power operation typically impose contradictory requirements in terms of architecture design. However, the proposed architecture lends itself to aggressive voltage scaling for low-power dissipation even under process parameter variations. Under a scaled supply voltage and/or variations in process parameters, any possible delay errors would only appear from the long paths that are less contributive towards PSNR improvement, providing large improvement in power dissipation with small PSNR degradation. Results show that even under large process variation and supply voltage scaling (0.8V), there is a gradual degradation of image quality with considerable power savings (62.8%) for the proposed architecture when compared to existing implementations in 70 nm process technology.

Original languageEnglish
Title of host publication2007 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3
Place of PublicationNEW YORK
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages630-635
Number of pages6
ISBN (Print)978-3-9810801-2-4
Publication statusPublished - 2007
EventDesign, Automation and Test in Europe Conference and Exhibition (DATE 07) - Nice, France
Duration: 16 Apr 200720 Apr 2007

Publication series

NameDesign Automation and Test in Europe Conference and Expo
PublisherIEEE
ISSN (Print)1530-1591

Conference

ConferenceDesign, Automation and Test in Europe Conference and Exhibition (DATE 07)
CountryFrance
Period16/04/200720/04/2007

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