Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

J. Wasyluk, Paul Rainey, T.S. Perova, Richard Hurley, Neil Mitchell, David McNeill, Harold Gamble, Mervyn Armstrong

Research output: Contribution to conferencePaper

Original languageEnglish
Pages0-0
Number of pages1
Publication statusPublished - Aug 2010
EventMicroscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Joint Symposium 2010 - University of Ulster, Belfast, United Kingdom
Duration: 25 Aug 201027 Aug 2010

Conference

ConferenceMicroscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Joint Symposium 2010
Country/TerritoryUnited Kingdom
CityBelfast
Period25/08/201027/08/2010

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