Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

J. Wasyluk; Paul Rainey; T.S. Perova; Richard Hurley; Neil Mitchell; David McNeill; Harold Gamble; Mervyn Armstrong

Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

J. Wasyluk, Paul Rainey, T.S. Perova, Richard Hurley, Neil Mitchell, David McNeill, Harold Gamble, Mervyn Armstrong

Research output: Contribution to conference › Paper

Original language	English
Pages	0-0
Number of pages	1
Publication status	Published - Aug 2010
Event	Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium - Belfast, United Kingdom Duration: 01 Aug 2010 → 01 Aug 2010

Conference

Conference	Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium
Country/Territory	United Kingdom
City	Belfast
Period	01/08/2010 → 01/08/2010

Cite this

Wasyluk, J., Rainey, P., Perova, T. S., Hurley, R., Mitchell, N., McNeill, D., Gamble, H., & Armstrong, M. (2010). Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology. 0-0. Paper presented at Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium, Belfast, United Kingdom.

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title = "Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology",

author = "J. Wasyluk and Paul Rainey and T.S. Perova and Richard Hurley and Neil Mitchell and David McNeill and Harold Gamble and Mervyn Armstrong",

year = "2010",

month = aug,

language = "English",

pages = "0--0",

note = "Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium ; Conference date: 01-08-2010 Through 01-08-2010",

}

Wasyluk, J, Rainey, P, Perova, TS, Hurley, R, Mitchell, N , McNeill, D, Gamble, H & Armstrong, M 2010, 'Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology', Paper presented at Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium, Belfast, United Kingdom, 01/08/2010 - 01/08/2010 pp. 0-0.

Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology. / Wasyluk, J.; Rainey, Paul; Perova, T.S. et al.

2010. 0-0 Paper presented at Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium, Belfast, United Kingdom.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

AU - Wasyluk, J.

AU - Rainey, Paul

AU - Perova, T.S.

AU - Hurley, Richard

AU - Mitchell, Neil

AU - McNeill, David

AU - Gamble, Harold

AU - Armstrong, Mervyn

PY - 2010/8

Y1 - 2010/8

M3 - Paper

SP - 0

EP - 0

T2 - Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium

Y2 - 1 August 2010 through 1 August 2010

ER -