Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

J. Wasyluk, Paul Rainey, T.S. Perova, Richard Hurley, Neil Mitchell, David McNeill, Harold Gamble, Mervyn Armstrong

Research output: Contribution to conferencePaper

Original languageEnglish
Pages0-0
Number of pages1
Publication statusPublished - Aug 2010
EventJoint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium - Belfast, United Kingdom
Duration: 01 Aug 201001 Aug 2010

Conference

ConferenceJoint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium
CountryUnited Kingdom
CityBelfast
Period01/08/201001/08/2010

Cite this

Wasyluk, J., Rainey, P., Perova, T. S., Hurley, R., Mitchell, N., McNeill, D., Gamble, H., & Armstrong, M. (2010). Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology. 0-0. Paper presented at Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium, Belfast, United Kingdom.