@conference{953620f57b1c41bfaa6593b8723deafe,
title = "Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology",
author = "J. Wasyluk and Paul Rainey and T.S. Perova and Richard Hurley and Neil Mitchell and David McNeill and Harold Gamble and Mervyn Armstrong",
year = "2010",
month = aug,
language = "English",
pages = "0--0",
note = "Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Joint Symposium 2010 ; Conference date: 25-08-2010 Through 27-08-2010",
}