Original language | English |
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Pages | 296-296 |
Number of pages | 1 |
DOIs | |
Publication status | Published - Oct 2009 |
Event | IEEE International Test Conference - Santa Clara, Ca, United States Duration: 01 Oct 2009 → 01 Oct 2009 |
Conference
Conference | IEEE International Test Conference |
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Country/Territory | United States |
City | Santa Clara, Ca |
Period | 01/10/2009 → 01/10/2009 |