Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy

S Jesse, S Guo, A Kumar, B J Rodriguez, R Proksch, S V Kalinin

Research output: Contribution to journalArticle

50 Citations (Scopus)

Abstract

Probing the functionality of materials locally by means of scanning probe microscopy (SPM) requires a reliable framework for identifying the target signal and separating it from the effects of surface morphology and instrument non-idealities, e.g. instrumental and topographical cross-talk. Here we develop a linear resolution theory framework in order to describe the cross-talk effects, and apply it for elucidation of frequency-dependent cross-talk mechanisms in piezoresponse force microscopy. The use of a band excitation method allows electromechanical/electrical and mechanical/topographic signals to be unambiguously separated. The applicability of a functional fit approach and multivariate statistical analysis methods for identification of data in band excitation SPM is explored.
Original languageEnglish
Pages (from-to)405703
JournalNanotechnology
Volume21
Issue number40
DOIs
Publication statusPublished - 2010

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