Sequential learning for adaptive critic design: An industrial control application

J.J. Govindhasamy, Seán McLoone, George Irwin

Research output: Contribution to conferencePaper

Original languageEnglish
Pages265-270
Number of pages6
Publication statusPublished - Sep 2005
EventIEEE Workshop on Machine Learning for Signal Processing (MLSP) - Mystic, Ct, United States
Duration: 01 Sep 200501 Sep 2005

Conference

ConferenceIEEE Workshop on Machine Learning for Signal Processing (MLSP)
CountryUnited States
CityMystic, Ct
Period01/09/200501/09/2005

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